Characteristics of Ti films for transition-edge sensor microcalorimeters

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 436, Issue 1-2, 1999, Pages 256-261

  Ukibe, M ^a   Koyanagi, M ^a   Ohkubo, M ^a   Pressler, H ^a   Kobayashi, N ^a  

^a ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; CRYOSTATS; HELIUM; HIGH TEMPERATURE OPERATIONS; METALLIC FILMS; SPUTTERING; SUBSTRATES; SUPERCONDUCTING TRANSITION TEMPERATURE; SURFACE ROUGHNESS; TITANIUM; X RAY SPECTROSCOPY;

ARGON PRESSURE; HELIUM CRYOSTAT; SUPERCONDUCTING TRANSITION EDGE SENSORS; TITANIUM FILMS; X RAY MICROCALORIMETERS;

CALORIMETERS;

EID: 0342868316     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(99)00631-2     Document Type: Article

References (4)

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2. Irwin K.D. Appl. Phys. Lett. 66:1995;1998.
3. Irwin K.D., Hilton G.C., Wollman D.A., Martinis J.M. J. Appl. Phys. Lett. 83:1998;3978.
4. Kanayama T., Itoh J. Bull. Electrotechn. Laboratory. 55:1991;1377.