Moiré patterns in scanning tunneling microscopy images of layered materials

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 1075-1078

  Kobayashi, Katsuyoshi ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0342796735     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588403     Document Type: Article

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