XAFS measurement of copper thin film by a simple detector in total-electron-yield mode

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 160, Issue 2, 2000, Pages 301-306

  Liu, T ^a   Xie, Y N ^a   Hu, T D ^a  

^a INSTITUTE OF HIGH ENERGY PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; COPPER; FLUORESCENCE; METAL FOIL; METALLIC FILMS; SYNCHROTRON RADIATION; THIN FILMS; X RAY SPECTROSCOPY;

X RAY ABSORPTION FINE STRUCTURE (XAFS) SPECTROSCOPY;

PHOTODETECTORS;

EID: 0342756832     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00534-0     Document Type: Article

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