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Volumn 364, Issue 5, 1999, Pages 404-409

A critical comparison of on-line coupling IC-ICP-(AES, MS) with competing analytical methods for ultra trace analysis of microelectronic materials

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0342728238     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160051357     Document Type: Conference Paper
Times cited : (6)

References (24)
  • 4
    • 0000892260 scopus 로고
    • Tölg G (1987) Analyst 112 : 365-376
    • (1987) Analyst , vol.112 , pp. 365-376
    • Tölg, G.1
  • 10
    • 0000658252 scopus 로고
    • Gijbels R (1990) Talanta 37 : 363-376
    • (1990) Talanta , vol.37 , pp. 363-376
    • Gijbels, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.