Morphologic defects in Cr3+:LiCaAlF6 crystals grown by the CZOCHRALSKI method

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3178, Issue , 1997, Pages 35-41

  Klimm, D ^a   Seiranian, K ^a   Reiche, P ^a   Polity, A ^b   Krause Rehberg, R ^b  

^a LEIBNIZ INSTITUTE FOR CRYSTAL GROWTH   (Germany)

^b MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

Author keywords

CZOCHRALSKI method; LASER host; LiCAF

Indexed keywords

CALCIUM; CHROMIUM; CRYSTAL DEFECTS; CRYSTALLOGRAPHY; CRYSTALS; GRAIN BOUNDARIES; GROWTH (MATERIALS); NEEDLES; TERNARY SYSTEMS; VAPOR PRESSURE;

BINARY COMPOUNDS; CZOCHRALSKI METHOD; CZOCHRALSKI METHODS; ELEMENT ANALYSES; ION BEAM THINNING; LASER HOST; LICAF; MELTING COMPOUNDS; OPTICAL QUALITIES; SCATTERING CENTERS; SMALL PARTICLES; STOICHIOMETRIC MELTS; VAPOUR PRESSURES;

SINGLE CRYSTALS;

EID: 0342717232     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.280747     Document Type: Conference Paper

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