Sensitivity analysis of transient measurements using the microwave cavity perturbation technique

Journal of Applied Physics

Volumn 83, Issue 2, 1998, Pages 837-842

  Subramanian, V ^a   Murthy, V R K ^a   Sobhanadri, J ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0342698258     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366765     Document Type: Article

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