Soft x-ray photoionization and fragmentation of SO2 studied by threshold photoelectron-photoion-photoion coincidence (TPEPIPICO) spectroscopy

Journal of Physics B: Atomic, Molecular and Optical Physics

Volumn 32, Issue 18, 1999, Pages 4437-4446

  Fisher, B O ^a   Thomas, M K ^a   Hatherly, P A ^a   Codling, K ^a   Stankiewicz, M ^b   Karawajczyk, A ^c   Roper, M ^d  

^a UNIVERSITY OF READING   (United Kingdom)

^b JAGIELLONIAN UNIVERSITY   (Poland)

^c ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^d DARESBURY LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMICS; ELECTRON ENERGY LEVELS; IONS; PHOTOELECTRON SPECTROSCOPY; PHOTOIONIZATION; PHOTONS; X RAYS;

FRAGMENTATION; ION BRANCHING RATIOS; SOFT X RAY PHOTOIONIZATION; THRESHOLD PHOTOELECTRON SPECTRA; TOTAL ION YIELD SPECTRA;

SILICA;

EID: 0342656209     PISSN: 09534075     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-4075/32/18/304     Document Type: Article

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