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Volumn 10, Issue 1, 1996, Pages 59-65

Estimation of the effective dielectric response from hopping activation energy in the vicinity of insulator-metal transition in semiconductors

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[No Author keywords available]

Indexed keywords


EID: 0342654461     PISSN: 02179792     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0217979296000040     Document Type: Article
Times cited : (13)

References (14)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.