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Volumn 10, Issue 1, 1996, Pages 59-65
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Estimation of the effective dielectric response from hopping activation energy in the vicinity of insulator-metal transition in semiconductors
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0342654461
PISSN: 02179792
EISSN: None
Source Type: Journal
DOI: 10.1142/S0217979296000040 Document Type: Article |
Times cited : (13)
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References (14)
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