Direct and post-injection oxide and interface trap generation resulting from low-temperature hot-electron injection

Journal of Applied Physics

Volumn 74, Issue 9, 1993, Pages 5582-5586

  Van Den Bosch, Geert ^a   Groeseneken, Guido ^a   Maes, Herman E ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0342637573     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.354219     Document Type: Article

References (19)