Surface plasmon reflection at edges and resonance effects in metal bars

Ultramicroscopy

Volumn 68, Issue 4, 1997, Pages 223-230

  Schröter, Ursula ^a   Seider, Stefan ^a   Tode, Siegfried ^a   Heitmann, Detlef ^a  

^a UNIVERSITY OF HAMBURG   (Germany)

Author keywords

Attenuated total reflection; Finite difference time domain method; Metallic microstructures; Optical near field; Surface plasmon

Indexed keywords

COMPUTER SIMULATION; FINITE DIFFERENCE METHOD; METALLIC FILMS; METALLOGRAPHIC MICROSTRUCTURE; RESONANCE; TIME DOMAIN ANALYSIS;

ATTENUATED TOTAL REFLECTION (ATR); FIELD PATTERNS; OPTICAL NEAR FIELD; SURFACE PLASMON REFLECTION;

BARS (METAL);

ALGORITHM; ARTICLE; DIELECTRIC CONSTANT; FOURIER TRANSFORMATION; NONHUMAN; OPTICAL DENSITY; RELAXATION TIME; SIMULATION; SURFACE PROPERTY; TECHNIQUE;

EID: 0342618376     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00030-2     Document Type: Article

References (9)

1. H. Raether, Surface Plasmons on Smooth and Rough Surfaces and on Gratings, Springer Tracts in Modern Physics, vol. 111, Springer, Berlin, 1988.
2. D. Heitmann, N. Kroo, C. Schulz, Zs. Szentirmay, Phys. Rev. B 35 (1987) 2660.
3. B. Fischer, T.M. Fischer, W. Knoll, Appl. Opt. 34 (1995) 5773.
4. D. Heitmann, J.P. Kotthaus, Phys. Today (1993) 56.
5. S.I. Bozhevolnyi, I.I. Smolyaninov, A.V. Zayats, Phys.Rev. B 51 (1995) 17916.
6. P. Dawson, F. deFornel, J.-P. Goudonnet, Phys. Rev. Lett. 72 (1994) 2927.
7. A. Taflove, M.E. Brodwin, IEEE Trans. Microwave Theory Tech MTT-23 (1975) 623.
8. D.A. Christensen, Ultramicroscopy 57 (1995) 189.
9. D.A. Christensen, D. Fowers, Biosensors and Bioelectronics 11 (1996) 677.