High-resolution electron-energy-loss spectroscopy of molecular multilayer film growth and properties

Journal of Electron Spectroscopy and Related Phenomena

Volumn 114-116, Issue , 2001, Pages 569-574

  Gootz B ^a   Krohl O ^a   Swiderek, P ^a  

^a UNIVERSITY OF COLOGNE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BENZENE; ELECTRON SCATTERING; FILM GROWTH; HIGH RESOLUTION ELECTRON MICROSCOPY; MOLECULAR SPECTROSCOPY; MOLECULAR VIBRATIONS; SULFUR COMPOUNDS; THIN FILMS;

MULTIPLE SCATTERING ANALYSIS;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 0342592329     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(00)00251-6     Document Type: Article

References (13)

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11. 2u) 43 meV.
12. B. Göötz, P. Swiderek, to be published.
13. Plotting the relative intensities of dipole and impact scattering is especially useful when the single data of a set have been obtained at somewhat different spectrometer resolution and thus exhibit variations of the absolute intensities. Using relative intensities, one can still make use of the data without introducing artefacts.