Spectrally resolved near-field mode imaging of vertical cavity semiconductor lasers

Journal of Applied Physics

Volumn 79, Issue 8, 1996, Pages 3831-3834

  Horsch I ^a   Kusche, R ^a   Marti, O ^a   Weigl, B ^a   Ebeling, K J ^a  

^a UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0342536342     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361810     Document Type: Article

References (10)

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