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Volumn 68, Issue 1, 1996, Pages 102-104

Reduced lateral straggling of implantation induced defects in III/V heterostructures by ion implantation along channeling directions

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0342529327     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116769     Document Type: Article
Times cited : (1)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.