Measurement of the transport spin-polarization of oxides using point contact andreev reflection (PCAR)

Physica C: Superconductivity and its Applications

Volumn 341-348, Issue PART 2, 2000, Pages 1527-1530

  Osofsky, M S ^a   Nadgorny, B ^a   Soulen Jr , R J ^a   Trotter, G ^b   Broussard, P ^a   Desisto, W ^a   Laprade, G ^c   Mukovskii, Y M ^d   Arsenov, A ^d  

^a NAVAL RESEARCH LABORATORY   (United States)

^b GEORGE WASHINGTON UNIVERSITY   (United States)

^c INSA   (France)

^d NATIONAL UNIVERSITY OF SCIENCE AND TECHNOLOGY MISIS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; ELECTRON TUNNELING; FERROMAGNETIC MATERIALS; MAGNETIC FIELD EFFECTS; MAGNETIC THIN FILMS; MAGNETIC VARIABLES MEASUREMENT; MAGNETORESISTANCE; POLARIZATION;

FERROMAGNETIC THIN FILMS; LOW TEMPERATURE SUPERCONDUCTOR; POINT CONTACT ANDREEV REFLECTION; POINT CONTACT TUNNELING; SPIN POLARIZATION; TRANSPORT SPIN POLARIZATION; TUNNELING MAGNETORESISTANCE;

OXIDE SUPERCONDUCTORS;

EID: 0342527704     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(00)01323-X     Document Type: Article

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