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Volumn 31, Issue 8, 1994, Pages 237-240

Use of microwave-induced plasma atomic emission detection for the quantification of oxygen containing compounds

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[No Author keywords available]

Indexed keywords


EID: 0342515730     PISSN: 0144557X     EISSN: None     Source Type: Journal    
DOI: 10.1039/AI9943100237     Document Type: Article
Times cited : (4)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.