SCOPUS 정보 검색 플랫폼

Volumn 69, Issue 1, 1997, Pages 13-23

Microanalysis of plastic strain

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRON DIFFRACTION; SHEAR DEFORMATION; STRAIN; SURFACE STRUCTURE; TRANSMISSION ELECTRON MICROSCOPY;

CONVERGENT BEAM ELECTRON DIFFRACTION (CBED); SURFACE MAPPING;

PLASTIC DEFORMATION;

PLASTIC;

ARTICLE; ATOMIC FORCE MICROSCOPY; CONFORMATIONAL TRANSITION; ELECTRON DIFFRACTION; MICROANALYSIS; STRESS STRAIN RELATIONSHIP;

EID: 0342506468 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-3991(97)00029-6 Document Type: Article

Times cited : (3)

References (11)

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2
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- Ma, Q.¹ Clarke, D.R.²

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- Dieter, G.E.¹

5
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- Walls, M.G.¹ Chaudhri, M.M.² Tang, T.B.³

6
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- M.M. Chaudhri, Phil. Mag. Lett. 53 (1992) L55.
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- Chaudhri, M.M.¹

7
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11
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