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Volumn 73, Issue 20, 1998, Pages 2911-2913

Orientation of graphitic planes during the bias-enhanced nucleation of diamond on silicon: An x-ray absorption near-edge study

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[No Author keywords available]

Indexed keywords


EID: 0342497105     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122627     Document Type: Article
Times cited : (28)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.