Muon diffusion in nanocrystalline copper

Hyperfine Interactions

Volumn 105, Issue 1-4, 1997, Pages 245-252

  Soetratmo, M ^a   Natter, H ^a   Hempelmann, R ^a   Hartmann, O ^b   Wappling R ^b   Ekstrom M ^b  

^a SAARLAND UNIVERSITY   (Germany)

^b UPPSALA UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0342445783     PISSN: 03043843     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (13)

1. H. Gleiter, Progr. Mater. Sci. 33 (1989) 223; H. Gleiter, J. Appl. Cryst. 24 (1991) 79.
2. H. Gleiter, Progr. Mater. Sci. 33 (1989) 223; H. Gleiter, J. Appl. Cryst. 24 (1991) 79.
3. L.E. Candlish, B.H. Kear and B.H. Kim, in: Conf. on Materials with Ultrafine Microstructures, Oct. 1-5, 1990, Atlantic City.
4. M.J. Lutton, S. Matras, J. Vallone and E. Hellum, ibid.
5. J. Karch, R. Birringer and H. Gleiter, Nature 330 (1987) 556.
6. V.G. Grebinnik, Sov. Phys.-JETP 41 (1975) 777.
7. H. Natter, T. Krajewski and R. Hempelmann, Ber. Bunsenges. Phys. Chem. 100 (1996) 55.
8. H. Natter and R. Hempelmann, to be published.
9. H.P. Klug, X-ray Diffraction Procedures (Wiley, New York, 1974).
10. R. Kubo, in: Magnetic Resonance and Relaxation, ed. R. Blinc (North-Holland, Amsterdam, 1966).
11. R.S. Hayano, Phys. Rev. B20 (1979) 850.
12. K. Kehr, Z. Phys. B32 (1978) 49.
13. D. Herlach, in: Recent Developments in Condensed Matter Physics, Vol. 1, ed. J.T. Devrese (Plenum, New York, 1981).