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Volumn 207, Issue Part_1_2, 1998, Pages 1-19

Cation Tracer Diffusion and Electrotransport in Semiconducting Cobaltous Oxide Co1-δO

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; COBALT; COUPLINGS; OXIDES; POINT DEFECTS; POSITIVE IONS;

EID: 0342420167     PISSN: 09429352     EISSN: None     Source Type: Journal    
DOI: 10.1524/zpch.1998.207.Part_1_2.001     Document Type: Article
Times cited : (10)

References (28)
  • 16
    • 20944451107 scopus 로고
    • eds. O. Kanert and J.-M. Spaeth, World Scientific, Singapore (1993)
    • M. Martin, in Defects in Insulating Materials, Vol. 1 (1992), p. 301, eds. O. Kanert and J.-M. Spaeth, World Scientific, Singapore (1993).
    • (1992) Defects in Insulating Materials , vol.1 , pp. 301
    • Martin, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.