Thickness of a silica-tethered poly(ethylene oxide) layer in a very good solvent measured by spin-labelling

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 111, Issue 3, 1996, Pages 177-184

  Afif, A ^a   Hommel, H ^a   Legrand, A P ^a  

^a CNRS   (France)

Author keywords

Poly(ethylene oxide); Silica; Spin labelling

Indexed keywords

GRAFTING (CHEMICAL); MOLECULES; PARAMAGNETIC RESONANCE; SILICA; SOLVENTS; SURFACES;

CHLOROFORM; SPIN LABELLING;

POLYETHYLENE OXIDES;

CHLOROFORM; ETHYLENE OXIDE; SILICON DIOXIDE; SOLVENT;

ARTICLE; ELECTRON SPIN RESONANCE; PRIORITY JOURNAL; SPIN LABELING; THICKNESS;

EID: 0342419808     PISSN: 09277757     EISSN: None     Source Type: Journal    
DOI: 10.1016/0927-7757(96)03517-0     Document Type: Article

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