Influence of the doping profile and deep level trap characteristics on generation-recombination noise

Journal of Applied Physics

Volumn 82, Issue 7, 1997, Pages 3351-3357

  Godoy, A ^a   Jimenez Tejada J A ^a   Palma, A ^a   Cartujo, P ^a  

^a UNIVERSITY OF GRANADA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0342403303     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365647     Document Type: Article

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