Surface temperature correction for active infrared reflectance measurements of natural materials

Applied Optics

Volumn 35, Issue 13, 1996, Pages 2216-2220

  Snyder, William C ^a   Wan, Zhengming ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Emissivity; Reflectance; Spectrometer; Thermal infrared

Indexed keywords

EID: 0342394098     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.002216     Document Type: Article

References (7)

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