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Volumn 39, Issue 2 A, 2000, Pages

Characterization of titanium oxide films prepared by liquid phase deposition using hexafluorotitanic acid

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; CURRENT DENSITY; DEPOSITION; FILM PREPARATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INORGANIC ACIDS; LEAKAGE CURRENTS; PERMITTIVITY; SILICA; SILICON WAFERS; TITANIUM DIOXIDE;

EID: 0342323733     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.l101     Document Type: Article
Times cited : (6)

References (25)
  • 8
    • 33645045763 scopus 로고
    • Ph. D Thesis, Delft University of Technology, The Netherlands.
    • J. G. M. Van Berkum: Ph. D Thesis, Delft University of Technology, The Netherlands. 1994.
    • (1994)
    • Van Berkum, J.G.M.1
  • 20
    • 0003472812 scopus 로고
    • Addison-Wesley, Reading, Chap. 13
    • B. E. Warren: X-ray Diffraction (Addison-Wesley, Reading, 1969) Chap. 13.
    • (1969) X-ray Diffraction
    • Warren, B.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.