Simulations of charge transport across a grain boundary in n-silicon bicrystals

Journal of Applied Physics

Volumn 83, Issue 10, 1998, Pages 5543-5545

  Joshi, R P ^a,b   Wood, R F ^b  

^a Old Dominion University   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0342291665     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367385     Document Type: Article

References (27)

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