Direct observation of charge distributions on photorefractive crystals with the force microscope

Journal of the Optical Society of America B: Optical Physics

Volumn 15, Issue 7, 1998, Pages 2185-2190

  Soergel, E ^a   Krieger, W ^a   Vlad, V I ^b  

^a MAX PLANCK INSTITUT FÜR QUANTENOPTIK   (Germany)

^b INSTITUTE OF ATOMIC PHYSICS   (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0342291378     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.15.002185     Document Type: Article

References (13)

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