Statistics and noise in a quantum measurement process

Physical Review Letters

Volumn 85, Issue 21, 2000, Pages 4578-4581

  Makhlin, Yuriy ^a,b   Schön, Gerd ^a,c   Shnirman, Alexander ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

^b LANDAU INSTITUTE FOR THEORETICAL PHYSICS   (Russian Federation)

^c KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CHARGE; ELECTRIC CURRENTS; PROBABILITY DISTRIBUTIONS; SPURIOUS SIGNAL NOISE; STATISTICAL METHODS; TRANSISTORS;

QUANTUM BITS; QUANTUM POINT CONTACTS (QPC); SINGLE-ELECTRON TRANSISTORS (SET);

QUANTUM THEORY;

EID: 0342281477     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.85.4578     Document Type: Article

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