Time-of-flight mass spectrometric analysis of ions produced from adjacent sample spots irradiated simultaneously by a single 337 nm laser [1]

Rapid Communications in Mass Spectrometry

Volumn 17, Issue 22, 2003, Pages 2557-2562

  Bogan, Michael J ^a   Agnes, George R ^a  

^a SIMON FRASER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

MASS SPECTROMETRIC ANALYSIS; TIME-OF FLIGHT;

MASS SPECTROMETRY;

ION;

CHEMICAL ANALYSIS; INTERMETHOD COMPARISON; IRRADIATION; LASER; LETTER; LIQUID CHROMATOGRAPHY; MASS SPECTROMETRY; MATRIX ASSISTED LASER DESORPTION IONIZATION TIME OF FLIGHT MASS SPECTROMETRY; SPECTRUM;

EID: 0242695754     PISSN: 09514198     EISSN: None     Source Type: Journal    
DOI: 10.1002/rcm.1215     Document Type: Letter

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