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Volumn 5048, Issue , 2003, Pages 63-72
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High throughput baggage scanning employing x-ray diffraction for accurate explosives detection
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTERIZED TOMOGRAPHY;
CRYSTALLIZATION;
EXPLOSIVES;
GERMANIUM;
PHOTONS;
SCANNING;
SINGLE CRYSTALS;
X RAY DIFFRACTION ANALYSIS;
EXPLOSIVES DETECTION;
NONDESTRUCTIVE EXAMINATION;
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EID: 0242693986
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.484697 Document Type: Conference Paper |
Times cited : (11)
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References (8)
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