Comparison of 3D Structural Characteristics of High and Low Resolution X-Ray Microtomographic Images of Paper and Board

International Paper Physics Conference, Proceedings

Volumn , Issue , 2003, Pages 65-69

  Holmstad, R ^a   Ramaswamy, S ^b   Goel, A ^b   Gregersen, O W ^a   Ramarao, B V ^b  

^a NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

PAPERBOARDS; STRUCTURAL ANALYSIS; SYNCHROTRON RADIATION; TOMOGRAPHY; X RAYS;

X RAY MICROTOMOGRAPHY;

PAPER;

PAPER; PAPER BOARDS; STRUCTURAL ANALYSIS; X RAYS;

EID: 0242661474     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

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11. http://www.skyscan.be/next/methods.htm
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