Essential features of residual stresses determination in thin-walled plane structures on a base of whole-field interferometric measurements

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4933, Issue , 2003, Pages 155-160

  Pisarev, V ^a   Odintsev, I ^a   Balalov, V ^a   Apalkov, A ^a  

^a CENTRAL AEROHYDRODYNAMIC INSTITUTE TSAGI   (Russian Federation)

Author keywords

Electronic speckle pattern interferometry (ESPI); Hole drilling method; Reflection hologram interferometry; Residual stress determination

Indexed keywords

HOLOGRAMS; MATHEMATICAL MODELS; RESIDUAL STRESSES; VECTORS;

REFLECTION HOLOGRAMS;

INTERFEROMETRY;

EID: 0242637522     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.516626     Document Type: Conference Paper

References (5)

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