TXRF characterization of inhomogeneous solids: Influence of surface morphology

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5133, Issue , 2003, Pages 129-135

  Alov, Nikolai V ^a   Oskolok, Kirill V ^a   Wittershagen, Axel ^b   Kolbesen, Bernd O ^c  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

^b SEZ AG   (Australia)

^c GOETHE UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; DEPOSITION; ELECTROCHEMISTRY; GLASS CERAMICS; NUCLEATION; SCANNING ELECTRON MICROSCOPY; SOLUTIONS; SURFACE TREATMENT; THIN FILMS; X RAY ANALYSIS;

X-RAY FLUORESCENCE;

ELECTROCHEMICAL ELECTRODES;

EID: 0242637370     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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