Admittance spectroscopy revisited: Single defect admittance and displacement current

Journal of Applied Physics

Volumn 94, Issue 9, 2003, Pages 5809-5813

  Karpov, V G ^a   Shvydka, Diana ^a   Jayamaha, U ^b   Compaan, A D ^a  

^a UNIVERSITY OF TOLEDO   (United States)

^b FIRST SOLAR   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CAPACITANCE; CHARGE TRANSFER; DEFECTS; FERMI LEVEL; SEMICONDUCTOR JUNCTIONS; SPECTROSCOPIC ANALYSIS;

DEFECT CAPACITANCE; DISPLACEMENT CURRENT;

ELECTRIC ADMITTANCE;

EID: 0242636858     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1617363     Document Type: Article

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