Dealing with Clutter in EMI Inversion and Classification Schemes for Buried UXO Discrimination

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5089, Issue 2, 2003, Pages 916-927

  O'Neill, Kevin ^a   Sun, Keli ^b   Shubitidze, Fridon ^b   Shamatava, Irma ^b   Liu, Lanbo ^a   Paulsen, Keith D ^b  

^a Engineer Research and Development Center   (United States)

^b DARTMOUTH COLLEGE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TARGET RECOGNITION; ELECTROMAGNETIC WAVE SCATTERING; MATHEMATICAL MODELS; ORDNANCE; PROBABILITY DISTRIBUTIONS; SENSOR DATA FUSION; SIGNAL PROCESSING; STATISTICAL METHODS;

BAYESIAN-INSPIRED STATISTICAL APPROACH (BIS); ELECTROMAGNETIC INDUCTION (EMI); SIMPLE LEAST SQUARE (SLS);

ELECTROMAGNETIC FIELD EFFECTS;

EID: 0242628847     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.487287     Document Type: Conference Paper

References (19)

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