Identification of Symptom Parameters for Failure Anticipation by Timed-Event Trend Analysis

IEEE Power Engineering Review

Volumn 20, Issue 9, 2000, Pages 48-49

  Kim, C J ^a  

^a Howard University   (United States)

Author keywords

Incipient fault; Laplace trend test; Symptom parameters

Indexed keywords

EID: 0242620056     PISSN: 02721724     EISSN: None     Source Type: Journal    
DOI: 10.1109/39.866872     Document Type: Article

References (8)

1. "Power distribution failure prediction - Final report," Research Agreement 96-200, Texas Engineering Experimentation Station. Dec. 1997.
2. V. Demjanenko, R.A. Valtin, M. Soumekh, H. Naidu, A. Antur, D.P. Hess, A. Soom, M.K. Tangri, S. Y. Park, D.M. Benenson, and S.E. Wright, "A noninvasive diagnostic instrument for power circuit breakers," IEEE Trans. Power Delivery, vol. 7, pp. 656-663, Apr. 1992.
3. H. Ohnishi, H. Yokoyama, T. Yoneyama, M. Aoyagi, Y. Akutsu, M. Kanoi, I. Iwashita, H. Haga, and M. Nakamura, "Insulation deterioration monitoring system for underground power distribution system," IEEE Trans. Power Delivery, vol. 9, pp. 1028-1033, Apr. 1994.
4. J. Cardos and K.L. Butler, "Field studies of incipient behavior in damaged underground cable," in Proc. 60th Annu. American Power Conf., vol. 60-I. Chicago, IL, 14-16 April 1998, pp. 522-526.
5. S. Khan, K.L. Butler, and B.D. Russell, "A predictive maintenance approach for power distribution systems," in Proc. 27th North American Power Symp., Bozeman, MT, Oct. 1995, pp. 700-707.
6. H.A. Ascher and C.K. Hansen, "Spurious exponentiality observed when incorrectly fitting a distribution to nonstationary data," IEEE Trans. Rel., vol. 47, pp. 451-459, Dec. 1998.
7. H.E. Ascher, T. Y. Lin, and D.P. Siewiorek, "Modification of error log analysis: Statistical modeling and heuristic trend analysis," IEEE Trans. Rel., vol. 41, pp. 599-601, Dec. 1992.
8. C.J. Kim, et al., "A Study on the characterization of the incipient failure behavior of insulators in power distribution line," IEEE Trans. Power Delivery, vol. 14, pp. 519-524, Apr. 1999.