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Volumn 40, Issue 1, 2004, Pages 95-100

Mean square error of the Empirical Transfer Function Estimator for stochastic input signals

Author keywords

ETFE; Frequency response; Non parametric model; Random input; System identification

Indexed keywords

IDENTIFICATION (CONTROL SYSTEMS); MATHEMATICAL MODELS; RANDOM PROCESSES; SIGNAL PROCESSING; TRANSFER FUNCTIONS;

EID: 0242608413     PISSN: 00051098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.automatica.2003.08.007     Document Type: Article
Times cited : (4)

References (13)
  • 1
    • 20244382556 scopus 로고
    • On bias in transfer functions estimated with stochastic excitation
    • Broersen, P. M. T. (1994). On bias in transfer functions estimated with stochastic excitation. Proceedings of the ICASSP conference, Adelaide, Vol. IV (pp. 49-52).
    • (1994) Proceedings of the ICASSP Conference , vol.4 , pp. 49-52
    • Broersen, P.M.T.1
  • 3
    • 20244375702 scopus 로고    scopus 로고
    • On the statistical accuracy of the empirical transfer function estimator
    • R. Smith (Ed.), Santa Barbara, USA
    • Broersen, P. M. T. (2001). On the statistical accuracy of the empirical transfer function estimator. In R. Smith (Ed.), Proceedings of the 12th IFAC symposium on system identification, Santa Barbara, USA (pp. 211-216).
    • (2001) Proceedings of the 12th IFAC Symposium on System Identification , pp. 211-216
    • Broersen, P.M.T.1
  • 6
    • 0022149663 scopus 로고
    • On the estimation of transfer functions
    • Ljung L. On the estimation of transfer functions. Automatica. 21:1985;677-696.
    • (1985) Automatica , vol.21 , pp. 677-696
    • Ljung, L.1
  • 10
    • 0036047103 scopus 로고    scopus 로고
    • Probability density function for frequency response function measurements using periodic signals
    • Anchorage, AK, USA, 21-23 May
    • Pintelon, R., Rolain, Y., & Van Moer, W. (2002). Probability density function for frequency response function measurements using periodic signals. IEEE instrumentation and measurement technology conference, Anchorage, AK, USA, 21-23 May (pp. 868-874).
    • (2002) IEEE Instrumentation and Measurement Technology Conference , pp. 868-874
    • Pintelon, R.1    Rolain, Y.2    Van Moer, W.3
  • 11
    • 0035722238 scopus 로고    scopus 로고
    • Measurement of frequency response functions using periodic excitations, corrupted by correlated input/output errors
    • Pintelon R., Schoukens J. Measurement of frequency response functions using periodic excitations, corrupted by correlated input/output errors. IEEE Transactions on Instrumentation and Measurement. 50:2001;1753-1760.
    • (2001) IEEE Transactions on Instrumentation and Measurement , vol.50 , pp. 1753-1760
    • Pintelon, R.1    Schoukens, J.2
  • 13
    • 0029288073 scopus 로고
    • Quantification of uncertainty in transfer function estimation: A mixed probabilistic worst-case approach
    • de Vries K., van den Hof P.M.J. Quantification of uncertainty in transfer function estimation. A mixed probabilistic worst-case approach Automatica. 31:1995;543-557
    • (1995) Automatica , vol.31 , pp. 543-557
    • De Vries, K.1    Van Den Hof, P.M.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.