Transmission and reflection ellipsometry of thin films and multilayer systems

Applied Optics

Volumn 37, Issue 7, 1998, Pages 1146-1151

  Bader, G ^a   Ashrit, P V ^a   Truong, Vo Van ^a  

^a UNIVERSITÉ DE MONCTON   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0242602660     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.001146     Document Type: Article

References (14)

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