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Volumn 433-436, Issue , 2003, Pages 365-370

Electrical and Optical Characterization of SiC

Author keywords

Admittance Spectroscopy; Aluminum Acceptors; Aluminum Related Defect Centers; FTIR Transmission; Hall Effect; Hall Scattering Factor for Holes; Phosphorus Donors

Indexed keywords

ALUMINUM; DOPING (ADDITIVES); FOURIER TRANSFORM INFRARED SPECTROSCOPY; HALL EFFECT; INFRARED RADIATION; OXIDATION; PHOSPHORUS;

EID: 0242581395     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.433-436.365     Document Type: Conference Paper
Times cited : (32)

References (15)
  • 7
    • 26144457298 scopus 로고
    • Dissertation, Erlangen
    • A. Schöner, Dissertation, Erlangen, 1994.
    • (1994)
    • Schöner, A.1
  • 15
    • 0242606398 scopus 로고    scopus 로고
    • Dissertation, Erlangen
    • T. Troffer, Dissertation, Erlangen, 1998.
    • (1998)
    • Troffer, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.