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Volumn 433-436, Issue , 2003, Pages 365-370
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Electrical and Optical Characterization of SiC
a a a a a a a b c d |
Author keywords
Admittance Spectroscopy; Aluminum Acceptors; Aluminum Related Defect Centers; FTIR Transmission; Hall Effect; Hall Scattering Factor for Holes; Phosphorus Donors
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Indexed keywords
ALUMINUM;
DOPING (ADDITIVES);
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
HALL EFFECT;
INFRARED RADIATION;
OXIDATION;
PHOSPHORUS;
ABSORPTION LINES;
SILICON CARBIDE;
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EID: 0242581395
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: 10.4028/www.scientific.net/msf.433-436.365 Document Type: Conference Paper |
Times cited : (32)
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References (15)
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