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Volumn 59, Issue 10, 2003, Pages

Bis(glycylglycinium) oxalate at 100 K

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; HYDROGEN BONDS; NEUTRON DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

EID: 0242579955     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270103018031     Document Type: Article
Times cited : (2)

References (21)
  • 19
    • 0004150157 scopus 로고    scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Winsconsin, USA
    • Sheldrick, G. M. (1990). SHELXTL. Siemens Analytical X-ray Instruments Inc., Madison, Winsconsin, USA.
    • (1990) SHELXTL.
    • Sheldrick, G.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.