Logarithmic corrections to scaling in critical percolation and random resistor networks

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 68, Issue 3 2, 2003, Pages 361291-3612914

  Stenull, Olaf ^a   Janssen, Hans Karl ^b  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b HEINRICH HEINE UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; FRACTALS; INTEGRATION; PERCOLATION (COMPUTER STORAGE); RESISTORS; TRANSPORT PROPERTIES;

LOGARITHMIC CORRECTIONS; RENORMALIZATION GROUPS;

COMPUTATIONAL COMPLEXITY;

EID: 0242579544     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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