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Volumn 9, Issue 2, 2003, Pages 301-306

Evaluation of spherical particle sizes with an asymmetric illumination microscope

Author keywords

Asymmetric illumination; Goniometry; Mie theory; Oblique microscopy; Polarized light microscopy

Indexed keywords

CAMERAS; DYE LASERS; IMAGE QUALITY; LENSES; LIGHT POLARIZATION; LIGHT SCATTERING; LIGHT SOURCES; NEODYMIUM LASERS; OPTICAL FIBERS; PARTICLE SIZE ANALYSIS; REFRACTIVE INDEX;

EID: 0242577496     PISSN: 1077260X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSTQE.2003.811289     Document Type: Article
Times cited : (10)

References (11)
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  • 4
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    • Particle size analysis of turbid media with a single optical fiber in contact with the medium to deliver and detect white light
    • M. Canpolat and J. R. Mourant, "Particle size analysis of turbid media with a single optical fiber in contact with the medium to deliver and detect white light," Appl. Opt.-OT, vol. 40, no. 22, pp. 3792-3799.
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    • Canpolat, M.1    Mourant, J.R.2
  • 5
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    • Measurement of three-dimensional velocity profiles in a thin channel flow using forward scattering particle image velocimetry (FSPIV)
    • J. D. Khaydarov and B. Ovryn, "Measurement of three-dimensional velocity profiles in a thin channel flow using forward scattering particle image velocimetry (FSPIV)," in Proc. ASME Fluids Eng. Div. Summer Meeting, 1996, pp. 4403-408.
    • Proc. ASME Fluids Eng. Div. Summer Meeting, 1996 , pp. 4403-4408
    • Khaydarov, J.D.1    Ovryn, B.2
  • 6
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    • Measurement of three-dimensional velocity profiles using forward scattering particle image velocimetry (FSPIV) and neural net pattern recognition
    • B. Ovryn, T. Wright, and J. D. Khaydarov, "Measurement of three-dimensional velocity profiles using forward scattering particle image velocimetry (FSPIV) and neural net pattern recognition," in Proc. SPIE, vol. 2546, 1995, pp. 112-124.
    • (1995) Proc. SPIE , vol.2546 , pp. 112-124
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  • 7
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    • (1984) Science , vol.227 , pp. 766-768
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  • 8
    • 0028106270 scopus 로고
    • Reduced-carrier single-sideband microscopy: A powerful method for the observation of transparent microscopical objects
    • F. Bretshneider and P. F. Teunis, "Reduced-carrier single-sideband microscopy: A powerful method for the observation of transparent microscopical objects," J. Microscopy, pt. 2, vol. 175, pp. 121-134, 1994.
    • (1994) J. Microscopy, Pt. 2 , vol.175 , pp. 121-134
    • Bretshneider, F.1    Teunis, P.F.2
  • 9
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    • Direct 3-D imaging using a multiple oblique microscope
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  • 10
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    • S. Chandrasekhar, Radiative Transfer. Oxford, U.K. and New York: Oxford Univ. Press and Dover, 1960.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.