Steganalysis of additive noise modelable information hiding

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5020, Issue , 2003, Pages 131-142

  Harmsen, Jeremiah J ^a   Pearlman, William A ^a  

^a Rensselaer Polytechnic Institute   (United States)

Author keywords

Additive noise; Steganalysis; Steganography

Indexed keywords

FREQUENCY DOMAIN ANALYSIS; LOW PASS FILTERS; PROBABILITY; SPECTRUM ANALYSIS;

ADDITIVE NOISE;

INFORMATION ANALYSIS;

EID: 0242576328     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.476813     Document Type: Conference Paper

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