Improved Uncertainty of Optical Frequency Domain Reflectometry Based Length Measurement by Linearizing the Frequency Chirping of a Laser Diode

Optical Review

Volumn 10, Issue 4, 2003, Pages 182-184

  Kakuma, Seiichi ^a   Ohmura, Kohhei ^a   Ohba, Ryoji ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

Author keywords

Block gauge; Laser diode; Length measurement; Optical frequency domain reflectometry

Indexed keywords

EID: 0242575873     PISSN: 13406000     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10043-003-0182-9     Document Type: Article

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