Strain behavior of thin film PbZr0.3Ti0.7O 3 (30/70) examined through piezoforce microscopy

Journal of Applied Physics

Volumn 94, Issue 9, 2003, Pages 5964-5968

  Dunn, S ^a  

^a CRANFIELD UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRODES; INTERFACES (MATERIALS); LEAD COMPOUNDS; SOL-GELS; STRAIN; WAVEFORM ANALYSIS;

PIEZOFORCE MICROSCOPY;

THIN FILMS;

EID: 0242552057     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1611635     Document Type: Article

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