Event pileup in charge-coupled devices

Astrophysical Journal

Volumn 562, Issue 1 PART I, 2001, Pages 575-582

  Davis, John E ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Instrumentation: Detectors; Methods: Analytical; Methods: Data analysis X rays: General

Indexed keywords

EID: 0242539595     PISSN: 0004637X     EISSN: 15384357     Source Type: Journal    
DOI: 10.1086/323488     Document Type: Article

References (6)

1. Ballet, J. 1999, A&AS, 135, 371
2. Davis, J. E. 2001, ApJ, 548, 1010
3. Fang, T., Marshall, H. L., Bryan, G. L., & Canizares, C. R. 2001, ApJ, 555, 356
4. Gorenstein, P., Gursky, H., & Garmire, G. 1968, ApJ, 153, 885
5. Houck, J. C., & DeNicoIa, L. A. 2000, in ASP Conf. Ser. 216, Astronomical Data Analysis Software and Systems IX, ed. N. Manset, C. Veillet, & D. Crabtree (San Francisco: ASP), 591
6. Jerius, D., Donnelly, R. H., Tibbetts, R. J., Edgar, R. J., Gaetz, T. J., Schwartz, D. A., Speybroeck, L. P., & Zhao, P. 2000, Proc. SPIE, 4012, 17