Material Optimization of Er3+:Y2SiO5 at 1.5 μm for Optical Processing, Memory, and Laser Frequency Stabilization Applications

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4988, Issue , 2003, Pages 51-61

  Böttger, Thomas ^a   Sun, Y ^a   Thiel, C W ^a   Cone, R L ^a  

^a MONTANA STATE UNIVERSITY   (United States)

Author keywords

1.5 m wavelength; Erbium; Optical coherent transients; Signal processing; Spectral diffusion; Spectral hole burning

Indexed keywords

ABSORPTION SPECTROSCOPY; DIFFUSION IN SOLIDS; EMISSION SPECTROSCOPY; ERBIUM COMPOUNDS; HOLOGRAPHY; LASER RECORDING; MOLECULAR CRYSTALS; OPTIMIZATION; RESONANCE; SPECTRUM ANALYSIS; THERMAL EFFECTS;

HOLE-BURNING PHENOMENON; OPTICAL RESONANCE; OPTICAL SIGNAL PROCESSING;

OPTICAL DATA STORAGE;

EID: 0242524438     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.474784     Document Type: Conference Paper

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