Irradiation qualification of CMS silicon tracker components with protons

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 514, Issue 1-3, 2003, Pages 167-172

  Dierlamm, A ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

Annealing; CMS; Irradiation; Quality control; Silicon strip detector

Indexed keywords

ANNEALING; MICROSTRIP DEVICES; PROTON IRRADIATION; QUALITY CONTROL; RADIATION HARDENING; SENSORS; SILICON;

MICROSTRIP DETECTORS;

NUCLEAR INSTRUMENTATION;

EID: 0242523047     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2003.08.101     Document Type: Conference Paper

References (6)

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2. Hartmann F. The CMS all-silicon tracker - strategies to ensure a high quality and radiation hard silicon detector. Nucl. Instr. and Meth. A. 478:2002;285.
3. CMS Tracker TDR, CERN/LHCC 98-6 CMS TDR 5, 1998.
4. Addendum to CMS Tracker TDR 5, CERN/LHCC 2000-016, 2000.
5. Wunstorf R.et al. Damage-induced surface effects in silicon detectors. Nucl. Instr. and Meth. A. 377:1996;290.
6. M. Moll, Ph.D. Thesis, DESY-THESIS-1999-040, 1999.