In-plane vector magnetometry on rectangular Co dots using polarized neutron reflectivity

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 21, Issue 5, 2003, Pages 2043-2047

  Temst, K ^a   Van Bael, M J ^a   Swerts, J ^a   Buntinx, D ^a   Van Haesendonck, C ^a   Bruynseraede, Y ^a   Fritzsche, H ^b   Jonckheere, R ^c  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b HAHN MEITNER INSTITUT   (Germany)

^c IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; DEPOSITION; ELECTRON BEAM LITHOGRAPHY; MAGNETIC ANISOTROPY; MAGNETIC FIELD EFFECTS; MAGNETIZATION; REFLECTION;

MOLECULAR BEAM DEPOSITION; POLARIZED NEUTRON REFLECTIVITY; RECTANGULAR POLYCRYSTALLINE MAGNETIC; VECTOR MAGNETOMETRY;

POLYCRYSTALLINE MATERIALS;

EID: 0242509087     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1605103     Document Type: Article

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