Effect of gas pressure on partial discharge in voids in epoxy

Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report

Volumn , Issue , 2003, Pages 628-632

  James, D Randy ^a   Sauers, I ^a   Ellis, A R ^a   Pace, M O ^a   Deschenes, D J ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC POTENTIAL; GROUNDING ELECTRODES; PRESSURE EFFECTS; SURFACES;

GAS PRESSURE;

PARTIAL DISCHARGES;

EID: 0242494217     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

1. F. Gutfleisch and L. Niemeyer, "Measurement and Simulation of PD in Epoxy Voids", IEEE Trans. Dielectrics EI., Vol. 2, No. 5, pp. 729-743, Oct. 1995
2. G. C. Crichton, P. W. Karlsson, and A. Pedersen, "Partial Discharges in Ellipsoidal and Spheroidal Voids", IEEE Trans. EI., Vol. 24, No. 2, pp. 335-342, April 1989
3. R. Bartnikas, "Corona Discharge Processes in Voids", in Engineering Dielectrics, Volume 1, Corona Measurement and Interpretation, ASTM Special Technical Pub. 669, Chapter 2, pp. 22-67, American Society for Testing and Materials, Philadelphia, 1979
4. T.Tanaka, "Internal Partial Discharge and Material Degradation", IEEE Trans. EI., Vol. EI-21, No. 6, pp. 899-905, December 1986
5. T. W. Dakin, G. Luxa, G. Oppermann, J. Vigreux, G. Wind, and H. Winkelnkemper, "Breakdown of Gases in Uniform Fields - Paschen Curves for Nitrogen, Air, and Sulfur Hexafluoride", Electra, No. 32, CIGRE, pp. 61-82, 1974
6. E. Husain and R. S. Nema, "Discharges at Low Pressures in Dielectric Voids", Conference Record 1982 IEEE Int. Symp. Elec. Insul., June 7-9, 1982, Philadelphia, PA, USA, IEEE Pub. No. 82CH1780-6-EI, pp. 91-94
7. S. Tsuru, M. Nakamura, T. Mine, J. Suehiro, and M. Hara, "Partial Discharge Inception Characteristics in Artificial Air-Filled Voids at Room and Liquid Nitrogen Temperatures", Conference Record 1998 IEEE Int. Symp. Elec. Insul., Arlington, VA, USA, June 7-10, 1998, IEEE Pub. No. 98CH36239, pp. 153-156
8. D. D. Chang, T. S. Sudarshan, and J. E. Thompson, "Analysis of Electric Stress Distribution in Cavities Embedded within Dielectric Structures", IEEE Trans. EI., Vol. EI-21, No. 2, pp. 213-219, April 1986