X-ray diffraction study of langasite film grown by liquid phase epitaxy

Journal of Materials Science Letters

Volumn 22, Issue 22, 2003, Pages 1621-1622

  Zhang, Hong ^a   Singh, N B ^a   Adam, J D ^a   Berghmans, A ^a   Tidrow, S ^b   Fazi, C ^b  

^a NORTHROP GRUMMAN CORPORATION   (United States)

^b U S ARMY RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; CRYSTAL STRUCTURE; IONS; LANTHANUM COMPOUNDS; LATTICE CONSTANTS; LIQUID PHASE EPITAXY; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; X RAY DIFFRACTION;

CRYSTAL QUALITY; NON-MONOCHROMATIC X-RAY SOURCE;

FILM GROWTH;

EID: 0242493848     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1026301011788     Document Type: Article

References (6)

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