New Approach to Solving Crack Tip Stress Fields for Piezoelectric Materials

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5053, Issue , 2003, Pages 376-386

  Oates, William S ^a   Lynch, Christopher S ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Fracture; Orthotropy rescaling; Piezoelectric; Stroh's formalism

Indexed keywords

ANISOTROPY; CRACK INITIATION; ELECTRIC FIELDS; FRACTURE TESTING; HARMONIC ANALYSIS; RESIDUAL STRESSES;

ORTHOTROPY RESCALING;

PIEZOELECTRIC MATERIALS;

EID: 0242442012     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.484080     Document Type: Conference Paper

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